HS 9031.41.00

用于检测晶圆或半导体器件（包括集成电路）或用于检测半导体器件（包括集成电路）制造中所用光掩模或掩模版

品目描述

印尼文: - - Untuk memeriksa wafer atau peralatan semi konduktor (termasuk integrated circuit) atau untuk memeriksa photomask atau reticle yang digunakan dalam pembuatan peralatan semikonduktor (termasuk integrated circuit)
中文: 用于检测晶圆或半导体器件（包括集成电路）或用于检测半导体器件（包括集成电路）制造中所用光掩模或掩模版机器翻译，以印尼文法定文本为准
英文: - - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
品目: 9031

税则层级

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.
- Other optical instruments and appliances :
- - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

计税口径：进口价值 Nilai Impor = CIF + BM；PPN = (CIF+BM) × 11/12 × 12%；PPh 22 = (CIF+BM) × 2.5%（有 API）或 7.5%（无 API）。

Form E (ACFTA / 中国-东盟)	0%	PMK 46/PMK.010/2022
RCEP-China	0%	PMK 224/PMK.010/2022

所有可用优惠税率都不低于 MFN，走 FTA 不划算

该编码在 INSW 数据中无 border / post-border 进口许可要求。

输入中文或印尼语商品描述，AI 会在 INSW 全量税则库内比对候选编码，必要时反问关键信息，再出具含税费测算与许可清单的预检报告。

9031.10.00 Machines for balancing mechanical parts
9031.20.00 Test benches
9031.49.10 Optical instruments and appliances for measuring surface particulate c…
9031.49.20 Optical error verification and repair apparatus for printed circuit bo…
9031.49.30 Other optical instruments and appliances for measuring or checking pri…
9031.49.90 Other
9031.80.10 Cable testers
9031.80.90 Other
9031.90.30 Parts and accessories including printed circuit assemblies of optical …
9031.90.40 Of optical error verification and repair apparatus for printed circuit…
9031.90.50 Of other optical instruments and appliances for measuring or checking …
9031.90.90 Other

数据抓取时间：2026-08-24T16:18:38.939Z　来源：INSW