HS 9031.90.30
用于检测晶圆或半导体器件或用于检测半导体器件制造中所用掩模、光掩模或掩模版的光学仪器及设备的零件及附件(包括printed circuit assembly);用于测量半导体晶圆表面颗粒污染的光学仪器及设备的零件及附件
品目描述
- 印尼文
- - - Bagian dan aksesori termasuk printed circuit assembly dari instrumen dan peralatan optik untuk memeriksa wafer atau peralatan semikonduktor atau untuk memeriksa mask, photomask atau reticle yang digunakan dalam pembuatan peralatan semikonduktor; bagian dan aksesori dari instrumen dan peralatan optik untuk mengukur kontaminasi partikel permukaan pada wafer semikonduktor
- 中文
- 用于检测晶圆或半导体器件或用于检测半导体器件制造中所用掩模、光掩模或掩模版的光学仪器及设备的零件及附件(包括printed circuit assembly);用于测量半导体晶圆表面颗粒污染的光学仪器及设备的零件及附件机器翻译,以印尼文法定文本为准
- 英文
- - - Parts and accessories including printed circuit assemblies of optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting masks, photomasks or reticles used in manufacturing semiconductor devices; parts and accessories of optical instruments and appliances for measuring surface particulate contamination on semiconductor wafers
- 品目
- 9031
税则层级
- Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this Chapter; profile projectors.
- - Parts and accessories :
- - - Parts and accessories including printed circuit assemblies of optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting masks, photomasks or reticles used in manufacturing semiconductor devices; parts and accessories of optical instruments and appliances for measuring surface particulate contamination on semiconductor wafers
进口税率
| 进口关税 Bea Masuk (MFN) | 0.00% | PMK Nomor 50 Tahun 2026 |
|---|---|---|
| 增值税 PPN | 12.00% | PMK Nomor 131 Tahun 2024 |
| 所得税 PPh 22(有 API) | 2.50% (API) | |
| 所得税 PPh 22(无 API) | 7.50% (NON-API) |
计税口径:进口价值 Nilai Impor = CIF + BM;PPN = (CIF+BM) × 11/12 × 12%;PPh 22 = (CIF+BM) × 2.5%(有 API)或 7.5%(无 API)。
FTA 优惠税率
| Form E (ACFTA / 中国-东盟) | 0% | PMK 46/PMK.010/2022 |
|---|---|---|
| RCEP-China | 0% | PMK 224/PMK.010/2022 |
所有可用优惠税率都不低于 MFN,走 FTA 不划算
进口管制 Lartas
该编码在 INSW 数据中无 border / post-border 进口许可要求。
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用 AI 智能归类你的商品 →品目 9031 下的其它编码
- 9031.10.00 Machines for balancing mechanical parts
- 9031.20.00 Test benches
- 9031.41.00 For inspecting semiconductor wafers or devices (including integrated c…
- 9031.49.10 Optical instruments and appliances for measuring surface particulate c…
- 9031.49.20 Optical error verification and repair apparatus for printed circuit bo…
- 9031.49.30 Other optical instruments and appliances for measuring or checking pri…
- 9031.49.90 Other
- 9031.80.10 Cable testers
- 9031.80.90 Other
- 9031.90.40 Of optical error verification and repair apparatus for printed circuit…
- 9031.90.50 Of other optical instruments and appliances for measuring or checking …
- 9031.90.90 Other
数据抓取时间:2026-08-24T16:20:01.414Z 来源:INSW